ROBUSt electROnic ciRcUit de Sign fOR yield OptimizatiOn
نویسنده
چکیده
The aim of this work is to assist designing of robust circuits to minimize the amount of defective circuits and therefore to increase the yield of production. The Fraunhofer ITWM considers electronic circuits at system level using its EDA software Analog Insydes, which allows analysis and symbolic approx ima tion of nominal analog circuits. The software now has been extended to handle parameter variations and analyse electronic circuits with process variations as well. By reducing a symbolic system to its most important terms, while keeping the statistical properties of the parameter variations, the simu lation time significantly decreases and new expertise concerning the most relevant parameters and the influence of their distributions on the system behaviour are generated. Both features are critical for a successful development of robust circuits and to optimize nano electronic systems.
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